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    System and method of measuring a sensor offset
    1.
    发明授权
    System and method of measuring a sensor offset 有权
    测量传感器偏移的系统和方法

    公开(公告)号：US08983788B2

    公开(公告)日：2015-03-17

    申请号：US12895924

    申请日：2010-10-01

    申请人： Wei D. Wang ,  Steven E. Schulz ,  Jeffrey David ,  Jackie L Cui ,  Andrew M. Zettel ,  Hanne Buur

    发明人： Wei D. Wang ,  Steven E. Schulz ,  Jeffrey David ,  Jackie L Cui ,  Andrew M. Zettel ,  Hanne Buur

    IPC分类号： G01D18/00

    CPC分类号： G01D18/006

    摘要： A method includes detecting a first event and executing a first procedure to identify a sensor offset in response to detecting the first event. The method further includes determining, via a computing device, whether the sensor offset was measured during the execution of the first procedure, scheduling a second procedure to execute in response to detecting a second event if the sensor offset was not measured during the first procedure, and scheduling the first procedure to execute in response to detecting a subsequent occurrence of the first event if the sensor offset was measured during the first procedure.

    摘要翻译： 一种方法包括检测第一事件并且执行第一过程以响应于检测到第一事件来识别传感器偏移。 该方法还包括经由计算设备确定在执行第一过程期间是否测量了传感器偏移量，如果在第一过程期间未测量传感器偏移量，则调度响应于检测到第二事件执行的第二过程， 以及如果在所述第一过程期间测量了所述传感器偏移量，则响应于检测到所述第一事件的后续出现来调度所述第一过程以执行。

    SYSTEM AND METHOD OF MEASURING A SENSOR OFFSET
    2.
    发明申请
    SYSTEM AND METHOD OF MEASURING A SENSOR OFFSET 有权
    测量传感器偏移的系统和方法

    公开(公告)号：US20120084039A1

    公开(公告)日：2012-04-05

    申请号：US12895924

    申请日：2010-10-01

    申请人： Wei D. Wang ,  Steven E. Schulz ,  Jeffrey David ,  Jackie L. Cui ,  Andrew M. Zettel ,  Hanne Buur

    发明人： Wei D. Wang ,  Steven E. Schulz ,  Jeffrey David ,  Jackie L. Cui ,  Andrew M. Zettel ,  Hanne Buur

    IPC分类号： G01D18/00

    CPC分类号： G01D18/006

    摘要： A method includes detecting a first event and executing a first procedure to identify a sensor offset in response to detecting the first event. The method further includes determining, via a computing device, whether the sensor offset was measured during the execution of the first procedure, scheduling a second procedure to execute in response to detecting a second event if the sensor offset was not measured during the first procedure, and scheduling the first procedure to execute in response to detecting a subsequent occurrence of the first event if the sensor offset was measured during the first procedure.

    摘要翻译： 一种方法包括检测第一事件并且执行第一过程以响应于检测到第一事件来识别传感器偏移。 该方法还包括经由计算设备确定在执行第一过程期间是否测量了传感器偏移量，如果在第一过程期间未测量传感器偏移量，则调度响应于检测到第二事件执行的第二过程， 以及如果在所述第一过程期间测量了所述传感器偏移量，则响应于检测到所述第一事件的后续出现来调度执行所述第一过程。