Invention Grant
- Patent Title: Apparatus and method for characterizing a replica tape
- Patent Title (中): 用于表征复制带的装置和方法
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Application No.: US14151066Application Date: 2014-01-09
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Publication No.: US08994933B2Publication Date: 2015-03-31
- Inventor: Leon Vandervalk , Robert V. Stachnik , James Edward Davis
- Applicant: DeFelsko Corporation
- Applicant Address: US NY Ogdensburg
- Assignee: DeFelsko Corporation
- Current Assignee: DeFelsko Corporation
- Current Assignee Address: US NY Ogdensburg
- Agency: Buchanan Ingersoll & Rooney PC
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01B11/06

Abstract:
An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.
Public/Granted literature
- US20140192346A1 APPARATUS AND METHOD FOR CHARACTERIZING A REPLICA TAPE Public/Granted day:2014-07-10
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