Invention Grant
- Patent Title: Specimen information acquisition system
- Patent Title (中): 标本信息采集系统
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Application No.: US13956623Application Date: 2013-08-01
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Publication No.: US08995615B2Publication Date: 2015-03-31
- Inventor: Kimiaki Yamaguchi , Toru Den
- Applicant: Canon Kabushiki Kaisha
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Priority: JP2012-172012 20120802
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/02 ; G21K1/02 ; H05G1/70

Abstract:
A specimen information acquisition system is provided with a first grating which divides divergent X-rays from an X-ray source to form a plurality of primary X-ray beams, and a second grating which blocks at least a part of each of the primary X-ray beams to form a plurality of secondary X-ray beams. The specimen information acquisition system is further provided with an X-ray detector which detects the secondary X-ray beams and a calculator which calculates information of a specimen arranged between the X-ray source and the X-ray detector. The primary X-ray beams do not overlap each other on each of X-ray transmitting portions of the second grating. The edges of the respective primary X-ray beams enter a plurality of X-ray blocking portions of the second grating.
Public/Granted literature
- US20140037054A1 SPECIMEN INFORMATION ACQUISITION SYSTEM Public/Granted day:2014-02-06
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