Invention Grant
US08995615B2 Specimen information acquisition system 有权
标本信息采集系统

Specimen information acquisition system
Abstract:
A specimen information acquisition system is provided with a first grating which divides divergent X-rays from an X-ray source to form a plurality of primary X-ray beams, and a second grating which blocks at least a part of each of the primary X-ray beams to form a plurality of secondary X-ray beams. The specimen information acquisition system is further provided with an X-ray detector which detects the secondary X-ray beams and a calculator which calculates information of a specimen arranged between the X-ray source and the X-ray detector. The primary X-ray beams do not overlap each other on each of X-ray transmitting portions of the second grating. The edges of the respective primary X-ray beams enter a plurality of X-ray blocking portions of the second grating.
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