Invention Grant
US08996919B2 Method and system providng a self-test on one or more sensors coupled to a device
有权
方法和系统在耦合到设备的一个或多个传感器上提供自检
- Patent Title: Method and system providng a self-test on one or more sensors coupled to a device
- Patent Title (中): 方法和系统在耦合到设备的一个或多个传感器上提供自检
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Application No.: US13797058Application Date: 2013-03-12
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Publication No.: US08996919B2Publication Date: 2015-03-31
- Inventor: Ge Gao , William Kerry Keal , James Lim
- Applicant: InvenSense, Inc.
- Applicant Address: US CA San Jose
- Assignee: InvenSense, Inc.
- Current Assignee: InvenSense, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Sawyer Law Group, P.C.
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/27 ; G06F11/22
Abstract:
A method and system for providing a self-test configuration in a device is disclosed. The method and system comprise providing a self-test mechanism in a kernel space of a memory and enabling a hook in a user space of the memory, wherein the hook is in communication with the self-test mechanism. The method and system also include running the self-test driver and utilizing the results.
Public/Granted literature
- US20130246848A1 METHOD AND SYSTEM PROVIDNG A SELF-TEST ON ONE OR MORE SENSORS COUPLED TO A DEVICE Public/Granted day:2013-09-19
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