Invention Grant
- Patent Title: Systems and methods for positive feedback short media defect detection
- Patent Title (中): 正反馈短介质缺陷检测的系统和方法
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Application No.: US13659795Application Date: 2012-10-24
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Publication No.: US08996970B2Publication Date: 2015-03-31
- Inventor: Fan Zhang , Weijun Tan , Shaohua Yang
- Applicant: LSI Corporation
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Hamilton DeSanctis & Cha
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/08 ; H03M13/29 ; H03M13/37 ; H03M13/00 ; H03M13/11 ; H03M13/41
Abstract:
Various systems and methods for media defect detection.
Public/Granted literature
- US20140115431A1 Systems and Methods for Positive Feedback Short Media Defect Detection Public/Granted day:2014-04-24
Information query
