Invention Grant
US09003755B2 Method and apparatus for measuring reflective intensity of display surface
有权
用于测量显示表面的反射强度的方法和装置
- Patent Title: Method and apparatus for measuring reflective intensity of display surface
- Patent Title (中): 用于测量显示表面的反射强度的方法和装置
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Application No.: US13813437Application Date: 2013-01-24
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Publication No.: US09003755B2Publication Date: 2015-04-14
- Inventor: Lixuan Chen , Chih-tsung Kang
- Applicant: Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Shenzhen, Guangdong
- Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd
- Current Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd
- Current Assignee Address: CN Shenzhen, Guangdong
- Agent Andrew C. Cheng
- Priority: CN201310011303 20130112
- International Application: PCT/CN2013/070939 WO 20130124
- International Announcement: WO2014/107925 WO 20140717
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G09G3/00

Abstract:
The present invention provides a method for measuring reflective intensity of display surface, including: obtaining a luminance value of a first display and a luminance value of a second display when displaying, the first display and the second display having the same observed luminance, the peripheral of the surface of the first display being surrounded by light-shielding object, the first display and the second display being placed side by side; and obtaining the reflective intensity of the display surface in the ambient based on the luminance value of the first display and the luminance values of the second display when displaying. As such, the present invention provides convenient and accurate means to measure the reflective intensity of display surface.
Public/Granted literature
- US20140198316A1 Method and Apparatus for Measuring Reflective Intensity of Display Surface Public/Granted day:2014-07-17
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