Invention Grant
- Patent Title: External force detecting method and external force detecting device
- Patent Title (中): 外力检测方法和外力检测装置
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Application No.: US13374759Application Date: 2012-01-10
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Publication No.: US09016128B2Publication Date: 2015-04-28
- Inventor: Mitsuaki Koyama , Takeru Mutoh , Hiroki Iwai
- Applicant: Mitsuaki Koyama , Takeru Mutoh , Hiroki Iwai
- Applicant Address: JP Tokyo
- Assignee: Nihon Dempa Kogyo Co., Ltd.
- Current Assignee: Nihon Dempa Kogyo Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Jordan and Hamburg LLP
- Priority: JP2011-006894 20110117; JP2011-079938 20110331; JP2011-137519 20110621
- Main IPC: G01H13/00
- IPC: G01H13/00 ; G01P15/097 ; G01P1/00 ; G01P1/02 ; G01P15/125 ; G01L1/14 ; G01L1/16 ; G01P15/08

Abstract:
A technique for detecting external force applied to a piezoelectric plate is provided. A crystal plate is cantilever-supported in a container. Excitation electrodes are formed on an upper face and lower face, respectively, of the crystal plate. A movable electrode is formed on the lower face side. A fixed electrode is provided on a bottom portion of the container facing the movable electrode. The excitation electrode on the upper face side and the fixed electrode are connected to an oscillation circuit. When the crystal plate bends by external force applied, capacitance between. A direction of the movable electrode along a length direction of the crystal plate is set to 30° to 60°, relative to a face orthogonal to an intended direction of the external force. The movable electrode and fixed electrode changes, and this capacitance change and a deformation of the crystal circuit.
Public/Granted literature
- US20120180567A1 External force detecting method and external force detecting device Public/Granted day:2012-07-19
Information query
IPC分类:
G | 物理 |
G01 | 测量;测试 |
G01H | 机械振动或超声波、声波或次声波的测量 |
G01H13/00 | 测量谐振(共振)频率 |