Invention Grant
US09019675B2 Method and structure for detecting an overcurrent in a triac
有权
用于检测三端双向可控硅开关元件中的过电流的方法和结构
- Patent Title: Method and structure for detecting an overcurrent in a triac
- Patent Title (中): 用于检测三端双向可控硅开关元件中的过电流的方法和结构
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Application No.: US13242928Application Date: 2011-09-23
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Publication No.: US09019675B2Publication Date: 2015-04-28
- Inventor: Jan Dreser , Laurent Gonthier
- Applicant: Jan Dreser , Laurent Gonthier
- Applicant Address: FR Tours
- Assignee: STMicroelectronics (Tours) SAS
- Current Assignee: STMicroelectronics (Tours) SAS
- Current Assignee Address: FR Tours
- Agency: Slater & Matsil, L.L.P.
- Priority: EP10306087 20101006
- Main IPC: H02H3/08
- IPC: H02H3/08 ; H02H9/02 ; G01R19/165
Abstract:
A method comprising: a) during at least part of a conduction phase of the triac, measuring the gate potential of the triac; and b) comparing a value based on said measurement with a reference threshold and deducing the presence or the absence of an overcurrent based on said comparison.
Public/Granted literature
- US20120087052A1 Method and Structure for Detecting an Overcurrent in a Triac Public/Granted day:2012-04-12
Information query
