Invention Grant
- Patent Title: Atomic layer deposition apparatus
- Patent Title (中): 原子层沉积装置
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Application No.: US14149560Application Date: 2014-01-07
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Publication No.: US09031685B2Publication Date: 2015-05-12
- Inventor: Barry L. Chin , Alfred W. Mak , Lawrence C. Lei , Ming Xi , Hua Chung , Ken Kaung Lai , Jeong Soo Byun
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: G06F19/00
- IPC: G06F19/00 ; C23C16/455 ; C23C16/458

Abstract:
A method and apparatus for atomic layer deposition (ALD) is described. In one embodiment, an apparatus comprises a vacuum chamber body having a contiguous internal volume comprised of a first deposition region spaced-apart from a second deposition region, the chamber body having a feature operable to minimize intermixing of gases between the first and the second deposition regions, a first gas port formed in the chamber body and positioned to pulse gas preferentially to the first deposition region to enable a first deposition process to be performed in the first deposition region, and a second gas port formed in the chamber body and positioned to pulse gas preferentially to the second deposition region to enable a second deposition process to be performed in the second deposition region is provided.
Public/Granted literature
- US20140130739A1 ATOMIC LAYER DEPOSITION APPARATUS Public/Granted day:2014-05-15
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