Invention Grant
US09036421B2 Strings of memory cells having string select gates, memory devices incorporating such strings, and methods of accessing and forming the same
有权
具有串选择门的存储单元的串,并入这样的字符串的存储器,以及访问和形成该字符串的方法
- Patent Title: Strings of memory cells having string select gates, memory devices incorporating such strings, and methods of accessing and forming the same
- Patent Title (中): 具有串选择门的存储单元的串,并入这样的字符串的存储器,以及访问和形成该字符串的方法
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Application No.: US14178526Application Date: 2014-02-12
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Publication No.: US09036421B2Publication Date: 2015-05-19
- Inventor: Zengtao Liu
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C7/10
- IPC: G11C7/10 ; G11C16/04 ; H01L27/115 ; H01L29/792 ; G11C16/14 ; G11C16/26

Abstract:
Strings of memory cells having a string select gate configured to selectively couple ends of a string to a data line and a source line concurrently, memory devices incorporating such strings and methods for accessing and forming such strings are provided. For example, non-volatile memory devices are disclosed that utilize vertical structure NAND strings of serially-connected non-volatile memory cells. One such string including two or more serially-connected non-volatile memory cells where each end of the string shares a string select gate with the other end of the string is disclosed.
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