In a conventional bistable liquid crystal device, switching characteristics fluctuate among panels and there is a problem in mass productivity. As an intermediate layer, an uneven film is inserted between a low anchoring layer and ITO. The uneven film has an average surface roughness of 2 nm or less, which is measured by an atomic force microscope. In this manner, the low anchoring layer is not affected by the surface shape of the ITO film which differs among panels, and the switching characteristics are stabilized.