发明授权
- 专利标题: Methods, apparatus and systems for surface type detection in connection with locate and marking operations
- 专利标题(中): 与定位和标记操作有关的表面类型检测方法,装置和系统
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申请号: US13210291申请日: 2011-08-15
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公开(公告)号: US09046413B2公开(公告)日: 2015-06-02
- 发明人: Steven Nielsen , Curtis Chambers , Jeffrey Farr , Jack M. Vice
- 申请人: Steven Nielsen , Curtis Chambers , Jeffrey Farr , Jack M. Vice
- 申请人地址: US FL Palm Beach Gardens
- 专利权人: CertusView Technologies, LLC
- 当前专利权人: CertusView Technologies, LLC
- 当前专利权人地址: US FL Palm Beach Gardens
- 主分类号: G01K11/30
- IPC分类号: G01K11/30 ; H04N7/18 ; E01C19/12 ; G01J3/02 ; G01J3/46 ; G01C15/02 ; G06K9/00
摘要:
Systems, methods, and apparatus for performing surface type detection in connection with locate and marking operations. In some embodiments, one or more sensors may be employed to collect information regarding a ground surface on which marking material is to be dispensed which is then analyzed to provide an estimate of a type of the surface. For example, a still-image or video camera may be used as a sensor that detects visible light reflecting from a surface. One or more images captured by the camera may be analyzed using analysis software to identify one or more characteristics indicative of a surface type. As another example, one or more radiation sensors may be employed to measure an amount of electromagnetic radiation reflected by the sensed surface one or more selected wavelengths or ranges of wavelengths to identify a spectral signature that may also be indicative of a surface type.
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