Invention Grant
US09046571B2 Tap with test compression architecture and start bit detector circuit
有权
点击测试压缩架构和起始位检测器电路
- Patent Title: Tap with test compression architecture and start bit detector circuit
- Patent Title (中): 点击测试压缩架构和起始位检测器电路
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Application No.: US13948801Application Date: 2013-07-23
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Publication No.: US09046571B2Publication Date: 2015-06-02
- Inventor: Lee D. Whetsel
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Lawrence J. Bassuk; Frank D. Cimino
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; G01R31/3185
Abstract:
The disclosure describes novel methods and apparatuses for controlling a device's TCA circuit when the device exists in a JTAG daisy-chain arrangement with other devices. The methods and apparatuses allow the TCA test pattern set used during device manufacturing to be reused when the device is placed in a JTAG daisy-chain arrangement with other devices, such as in a customers system using the device. Additional embodiments are also provided and described in the disclosure.
Public/Granted literature
- US20130311842A1 TEST COMPRESSION IN A JTAG DAISY-CHAIN ENVIRONMENT Public/Granted day:2013-11-21
Information query
