DEVICE ACCESS PORT SELECTION
    7.
    发明公开

    公开(公告)号:US20230296670A1

    公开(公告)日:2023-09-21

    申请号:US18200047

    申请日:2023-05-22

    发明人: Lee D. Whetsel

    摘要: The disclosure describes a novel method and apparatuses for allowing a controller to select and access different types of access ports in a device. The selecting and accessing of the access ports is achieved using only the dedicated TDI, TMS, TCK, and TDO signal terminals of the device. The selecting and accessing of device access ports can be achieved when a single device is connected to the controller, when multiple devices are placed in a daisy-chain arrangement and connected to the controller, or when multiple devices are placed in a addressable parallel arrangement and connected to the controller. Additional embodiments are also provided and described in the disclosure.

    Integrated circuit die test architecture

    公开(公告)号:US11726135B2

    公开(公告)日:2023-08-15

    申请号:US17858122

    申请日:2022-07-06

    发明人: Lee D. Whetsel

    摘要: A test control port (TCP) includes a state machine SM, an instruction register IR, data registers DRs, a gating circuit and a TDO MX. The SM inputs TCI signals and outputs control signals to the IR and to the DR. During instruction or data scans, the IR or DRs are enabled to input data from TDI and output data to the TDO MX and the top surface TDO signal. The bottom surface TCI inputs may be coupled to the top surface TCO signals via the gating circuit. The top surface TDI signal may be coupled to the bottom surface TDO signal via TDO MX. This allows concatenating or daisy-chaining the IR and DR of a TCP of a lower die with an IR and DR of a TCP of a die stacked on top of the lower die.