Invention Grant
US09047550B2 Image formation apparatus configured to detect and correct detected light reflection characteristics 有权
被配置为检测和校正检测到的光反射特性的图像形成装置

  • Patent Title: Image formation apparatus configured to detect and correct detected light reflection characteristics
  • Patent Title (中): 被配置为检测和校正检测到的光反射特性的图像形成装置
  • Application No.: US14333863
    Application Date: 2014-07-17
  • Publication No.: US09047550B2
    Publication Date: 2015-06-02
  • Inventor: Hideki Shinyama
  • Applicant: Oki Data Corporation
  • Applicant Address: JP Tokyo
  • Assignee: Oki Data Corporation
  • Current Assignee: Oki Data Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: MOTS LAW, PLLC
  • Agent Marvin A. Motsenbocker
  • Priority: JP2013-150192 20130719
  • Main IPC: G06K15/00
  • IPC: G06K15/00 G06K15/16
Image formation apparatus configured to detect and correct detected light reflection characteristics
Abstract:
An image formation apparatus includes a conveyance member in which a reflection characteristics irregular part having light reflection characteristics different from those of a surrounding surface part is formed, a measurement unit configured to perform an detection operation including irradiating the conveyance member with irradiation light and detecting reflection light, a controller configured to perform a current detection operation, and perform a next detection operation after a surface of the conveyance member is moved by a distance longer than a reflection characteristics irregular part length that is a length of the reflection characteristics irregular part in a movement direction of the conveyance member surface, and a correction unit configured to perform correction for image formation on the basis of detection results of the current detection operation and the next detection operation by the measurement unit.
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