发明授权
- 专利标题: Asymmetric log-likelihood ratio for flash channel
- 专利标题(中): 闪光通道的非对称对数似然比
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申请号: US14500904申请日: 2014-09-29
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公开(公告)号: US09047984B2公开(公告)日: 2015-06-02
- 发明人: Xinde Hu
- 申请人: HGST NETHERLANDS B.V.
- 申请人地址: NL Amsterdam
- 专利权人: HGST Netherlands B.V.
- 当前专利权人: HGST Netherlands B.V.
- 当前专利权人地址: NL Amsterdam
- 代理机构: McDermott Will & Emery LLP
- 主分类号: G11C16/04
- IPC分类号: G11C16/04 ; G11C11/56
摘要:
Disclosed is a system and method for reading a flash memory cell with an adjusted read level. A current read level is set to a new read level associated with increasing a first error rate to decrease a second error rate. The first error rate is associated with determining that the most significant bit of the flash memory cell is a binary 1 and the second error rate is associated with determining that the most significant bit is a binary 0. On reading the memory cell, a probability value is generated for the most significant bit, the probability being higher if the bit is equivalent to a binary 0 than if the bit is equivalent to a binary 1.
公开/授权文献
- US20150016187A1 ASYMMETRIC LOG-LIKELIHOOD RATIO FOR FLASH CHANNEL 公开/授权日:2015-01-15
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