发明授权
- 专利标题： Method of deposition monitoring
- 专利标题（中）： 沉积监测方法
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申请号： US13952395申请日： 2013-07-26
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公开(公告)号： US09063080B2公开(公告)日： 2015-06-23
- 发明人: Prasad Y. Duggirala , Sergey M. Shevchenko , Michael J. Murcia
- 申请人： Ecolab USA Inc.
- 申请人地址： US IL Naperville
- 专利权人： ECOLAB USA INC.
- 当前专利权人： ECOLAB USA INC.
- 当前专利权人地址： US IL Naperville
- 代理商 Benjamin Carlsen
- 主分类号： G01N21/41
- IPC分类号： G01N21/41 ; G01N21/43 ; G01N17/00 ; G01N21/94
摘要：
The invention provides methods and compositions for measuring the formation of scale within a process system. The method involves measuring changes in the cell fouling as reflected on the refraction index measurements of a liquid medium with a refractometer and determining the scale formation from changes in the cell fouling factor. This allows for a refractometer to determine the formation of scale in locations that otherwise would not be measurable.
公开/授权文献
- US20150029496A1 METHOD OF DEPOSITION MONITORING 公开/授权日：2015-01-29
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