Invention Grant
- Patent Title: Multiple concurrent spectral analyses
- Patent Title (中): 多个并发光谱分析
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Application No.: US13754283Application Date: 2013-01-30
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Publication No.: US09074937B2Publication Date: 2015-07-07
- Inventor: Huei Pei Kuo , Zhiyong Li , Shih-Yuan Wang , Steven J. Barcelo , Ansoon Kim , Gary Gibson , Alexandre M Bratkovski
- Applicant: Hewlett-Packard Development Company, L.P.
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: Mannava & Kang, P.C.
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01J3/44 ; G01J3/02 ; G01J3/28

Abstract:
According to an example, apparatuses for performing multiple concurrent spectral analyzes on a sample under test include an optical system to concurrently direct a plurality of light beams onto analytes at multiple locations on the sample under test, in which the plurality of light beams cause light in either or both of a Raman spectra and a non-Raman spectra to be emitted from the analytes at the multiple locations of the sample under test. The apparatuses also include a detector to concurrently acquire a plurality of spectral measurements of the light emitted from the analytes at the multiple locations of the sample under test. Example methods of performing spectral analysis include use of the apparatuses.
Public/Granted literature
- US20140211199A1 MULTIPLE CONCURRENT SPECTRAL ANALYSES Public/Granted day:2014-07-31
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