Invention Grant
US09076501B2 Apparatuses and methods for reducing current leakage in a memory
有权
用于减少存储器中的电流泄漏的装置和方法
- Patent Title: Apparatuses and methods for reducing current leakage in a memory
- Patent Title (中): 用于减少存储器中的电流泄漏的装置和方法
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Application No.: US13970518Application Date: 2013-08-19
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Publication No.: US09076501B2Publication Date: 2015-07-07
- Inventor: Zhong-yi Xia , Scott J. Derner , Charles L. Ingalls , Howard C. Kirsch
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C16/28
- IPC: G11C16/28 ; G11C7/06 ; G11C7/12

Abstract:
Apparatuses, sense amplifier circuits, and methods for operating a sense amplifier circuit in a memory are described. An example apparatus includes a sense amplifier circuit configured to be coupled to a digit line and configured to, during a memory access operation, drive the digit line to a voltage that indicates the logical value of the charge stored by a memory cell coupled to the digit line. During an initial time period of the memory access operation, the sense amplifier circuit is configured to drive the digit line to a first voltage that indicates the logical value of the charge stored by the memory cell. After the initial time period, the sense amplifier circuit is configured to drive the digit line to a second voltage different than the first voltage that indicates the logical value of the charge stored by the memory cell.
Public/Granted literature
- US20150049565A1 APPARATUSES AND METHODS FOR REDUCING CURRENT LEAKAGE IN A MEMORY Public/Granted day:2015-02-19
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