Invention Grant
US09076501B2 Apparatuses and methods for reducing current leakage in a memory 有权
用于减少存储器中的电流泄漏的装置和方法

Apparatuses and methods for reducing current leakage in a memory
Abstract:
Apparatuses, sense amplifier circuits, and methods for operating a sense amplifier circuit in a memory are described. An example apparatus includes a sense amplifier circuit configured to be coupled to a digit line and configured to, during a memory access operation, drive the digit line to a voltage that indicates the logical value of the charge stored by a memory cell coupled to the digit line. During an initial time period of the memory access operation, the sense amplifier circuit is configured to drive the digit line to a first voltage that indicates the logical value of the charge stored by the memory cell. After the initial time period, the sense amplifier circuit is configured to drive the digit line to a second voltage different than the first voltage that indicates the logical value of the charge stored by the memory cell.
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