Invention Grant
- Patent Title: Methods for high precision microelectronic die integration
- Patent Title (中): 高精度微电子管芯集成方法
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Application No.: US13908016Application Date: 2013-06-03
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Publication No.: US09076882B2Publication Date: 2015-07-07
- Inventor: Aleksandar Aleksov , Ravindranath V Mahajan , Omkar Karhade , Nitin Deshpande
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Winkle, PLLC
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L23/00

Abstract:
The subject matter of the present description relates to methods for the precise integration of microelectronic dice within a multichip package which substantially reduce or eliminate any misalign caused by the movement of the microelectronic dice during the integration process. These methods may include the use of a temporary adhesive in conjunction with a carrier having at least one recess for microelectronic die alignment, the use of a precision molded carrier for microelectronic die alignment, the use of magnetic alignment of microelectronic dice on a reusable carrier, and/or the use of a temporary adhesive with molding processes on a reusable carrier.
Public/Granted literature
- US20140357020A1 METHODS FOR HIGH PRECISION MICROELECTRONIC DIE INTEGRATION Public/Granted day:2014-12-04
Information query
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