Invention Grant
- Patent Title: Buffer testing for reconfigurable instruction cell arrays
- Patent Title (中): 可重构指令单元阵列的缓冲测试
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Application No.: US14046084Application Date: 2013-10-04
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Publication No.: US09081060B2Publication Date: 2015-07-14
- Inventor: Hari Rao , Venkatasubramanian Narayanan , Venugopal Boynapalli , Sagar Suresh Sabade , Bilal Zafar
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Haynes and Boone, LLP
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; G01R31/3185 ; G06F11/27 ; G01R31/3187

Abstract:
A reconfigurable instruction cell array (RICA) is provided that includes a plurality of master switch boxes that are configured to read and write from a plurality of buffers through a cross-bar switch. A master built-in-self-test (MBIST) engine is configured to drive a test word into the write path of at least one master switch box and to control the cross-bar switch so that the driven test word is broadcast to all the buffers for storage. The MBIST engine is also configured to retrieve the stored test words from the buffers through a read bus within the cross-bar switch.
Public/Granted literature
- US20150100842A1 BUFFER TESTING FOR RECONFIGURABLE INSTRUCTION CELL ARRAYS Public/Granted day:2015-04-09
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