Invention Grant
- Patent Title: Method for encapsulating semiconductor and structure thereof
- Patent Title (中): 封装半导体的方法及其结构
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Application No.: US13710764Application Date: 2012-12-11
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Publication No.: US09082777B2Publication Date: 2015-07-14
- Inventor: Xiong Yang
- Applicant: Huawei Device Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: HUAWEI DEVICE CO., LTD.
- Current Assignee: HUAWEI DEVICE CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: Staas & Halsey LLP
- Main IPC: H01L21/56
- IPC: H01L21/56 ; H01L21/58 ; H01L23/31 ; H01L25/16

Abstract:
Embodiments of the present invention disclose a method for encapsulating a component with plastic and its encapsulation structure, which belong to the plastic encapsulation technology field. The method includes: processing, by using the surface mounting technology, a first surface of a part to be encapsulated with plastic and/or performing die bonding on the first surface; encapsulating, with plastic, the first surface of the part to be encapsulated with plastic a second surface of the part to be encapsulated with plastic the first surface and/or performing die bonding in the second face; and encapsulating, with plastic, the second surface of the part to be encapsulated with plastic. This encapsulation structure includes a substrate, where components are fixed on an upper surface and a lower surface of the substrate, and the components on the upper surface and lower surface are all encapsulated with plastic in seal.
Public/Granted literature
- US20130102113A1 METHOD FOR ENCAPSULATING SEMICONDUCTOR AND STRUCTURE THEREOF Public/Granted day:2013-04-25
Information query
IPC分类: