A capacitor measurement circuit for measuring a capacitance of a test capacitor includes a first transistor with a first source-drain path coupled between a first capacitor plate of the test capacitor and a ground; a second transistor with a second source-drain path coupled between a second capacitor plate of the test capacitor and the ground; and a current-measuring device configured to measure a first charging current and a second charging current of the test capacitors. The first and the second charging currents flow to the test capacitor in opposite directions.