Invention Grant
- Patent Title: Lateral flow assay systems and methods
- Patent Title (中): 侧流测定系统和方法
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Application No.: US13360081Application Date: 2012-01-27
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Publication No.: US09091631B2Publication Date: 2015-07-28
- Inventor: Patrick T. Petruno , John F. Petrilla , Michael J. Brosnan , Rong Zhou , Daniel B. Roitman
- Applicant: Patrick T. Petruno , John F. Petrilla , Michael J. Brosnan , Rong Zhou , Daniel B. Roitman
- Applicant Address: US CA San Jose
- Assignee: Alverix, Inc.
- Current Assignee: Alverix, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Knobbe Martens Olson & Bear LLP
- Main IPC: G01N21/17
- IPC: G01N21/17 ; G01N21/84 ; G01N33/558

Abstract:
In one aspect, a diagnostic test system includes a housing, a reader, and a data analyzer. The housing includes a port for receiving a test strip. The reader obtains separable light intensity measurements from localized regions of an area of the detection zone exposed for optical inspection, wherein each of the localized regions is characterized by at least one surface dimension smaller than the first dimension. The data analyzer identifies ones of the light intensity measurements obtained from the at least one test region and computes at least one parameter from the identified ones of the light intensity measurements. In another aspect, the reader obtains a respective set of light intensity measurements from each of multiple corresponding regions of the exposed surface area of the detection zone, and the data analyzer computes at least one parameter from at least one of the sets of light intensity measurements.
Public/Granted literature
- US20120129272A1 LATERAL FLOW ASSAY SYSTEMS AND METHODS Public/Granted day:2012-05-24
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