发明授权
US09105448B2 Electron beam diagnostic system using computed tomography and an annular sensor
有权
使用计算机断层扫描和环形传感器的电子束诊断系统
- 专利标题： Electron beam diagnostic system using computed tomography and an annular sensor
- 专利标题（中）： 使用计算机断层扫描和环形传感器的电子束诊断系统
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申请号： US14305905申请日： 2014-06-16
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公开(公告)号： US09105448B2公开(公告)日： 2015-08-11
- 发明人: John W. Elmer , Alan T. Teruya
- 申请人： Lawrence Livermore National Security, LLC
- 申请人地址： US CA Livermore
- 专利权人： Lawrence Livermore National Security, LLC
- 当前专利权人： Lawrence Livermore National Security, LLC
- 当前专利权人地址： US CA Livermore
- 代理商 Eddie E. Scott
- 主分类号： H01J37/244
- IPC分类号： H01J37/244 ; G01T1/29 ; H01J37/315
摘要：
A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.
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