Invention Grant
- Patent Title: Techniques for improving reliability of a fault current limiting system
- Patent Title (中): 提高故障限流系统可靠性的技术
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Application No.: US13493782Application Date: 2012-06-11
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Publication No.: US09121879B2Publication Date: 2015-09-01
- Inventor: Kasegn D. Tekletsadik , Paul J. Murphy , Mark R. Amato , James D. Strassner
- Applicant: Kasegn D. Tekletsadik , Paul J. Murphy , Mark R. Amato , James D. Strassner
- Applicant Address: US MA Gloucester
- Assignee: Varian Semiconductor Equipment Associates, Inc.
- Current Assignee: Varian Semiconductor Equipment Associates, Inc.
- Current Assignee Address: US MA Gloucester
- Main IPC: G01R31/25
- IPC: G01R31/25 ; G01R31/00 ; H02H9/08 ; G01R33/12 ; H02H7/00

Abstract:
Techniques for improving reliability of a superconducting fault current limiting system (SCFCL) are provided. In one particular exemplary embodiment, the technique may be realized as a method of improving a reliability of a superconducting fault current limiting system (SCFCL), the SCFCL system comprising a superconductor provided in a container. The method may comprise providing one or more sensors capable of detecting a fault current proximate to the superconductor; determining a change in the condition of the superconductor as a result of the fault current; and estimating the lifetime of the superconductor based on the change in the condition of the superconductor.
Public/Granted literature
- US20130221979A1 TECHNIQUES FOR IMPROVING RELIABILITY OF A FAULT CURRENT LIMITING SYSTEM Public/Granted day:2013-08-29
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