Invention Grant
- Patent Title: Transistor having a stressed body
- Patent Title (中): 具有受压体的晶体管
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Application No.: US14494979Application Date: 2014-09-24
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Publication No.: US09123809B2Publication Date: 2015-09-01
- Inventor: Nicolas Loubet , Prasanna Khare , Qing Liu
- Applicant: STMicroelectronics, Inc.
- Applicant Address: US TX Coppell
- Assignee: STMicroelectronics, Inc.
- Current Assignee: STMicroelectronics, Inc.
- Current Assignee Address: US TX Coppell
- Agency: Gardere Wynne Sewell LLP
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/78 ; H01L21/265 ; H01L29/66 ; H01L21/8238 ; H01L21/84 ; H01L27/12 ; H01L21/266 ; H01L21/762 ; H01L29/06

Abstract:
A transistor includes a body and a semiconductor region configured to stress a portion of the body. For example, stressing a channel of the transistor may increase the mobility of carriers in the channel, and thus may reduce the “on” resistance of the transistor. For example, the substrate, source/drain regions, or both the substrate and source/drain regions of a PFET may be doped to compressively stress the channel so as to increase the mobility of holes in the channel. Or, the substrate, source/drain regions, or both the substrate and source/drain regions of an NFET may be doped to tensile stress the channel so as to increase the mobility of electrons in the channel.
Public/Granted literature
- US20150008521A1 TRANSISTOR HAVING A STRESSED BODY Public/Granted day:2015-01-08
Information query
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