Invention Grant
- Patent Title: Light source support apparatus and optical radiation characteristic measurement apparatus using the same
- Patent Title (中): 光源支持装置和使用其的光辐射特性测量装置
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Application No.: US13753521Application Date: 2013-01-30
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Publication No.: US09127832B2Publication Date: 2015-09-08
- Inventor: Hisashi Shiraiwa , Takeshi Kamada
- Applicant: Otsuka Electronics Co., Ltd.
- Applicant Address: JP Hirakata-Shi
- Assignee: OTSUKA ELECTRONICS CO., LTD.
- Current Assignee: OTSUKA ELECTRONICS CO., LTD.
- Current Assignee Address: JP Hirakata-Shi
- Agency: Mori & Ward, LLP
- Priority: JP2012-036087 20120222
- Main IPC: G01J1/02
- IPC: G01J1/02 ; F21V21/14 ; G01J1/42

Abstract:
A light source support apparatus includes: a base member; a first support member supporting the base member rotatably about a first axis; first and second arm members connected respectively to opposite ends of the base member and extending in a direction parallel to the first axis; and a pair of second support members disposed at respective positions, which are opposite to each other, of the first and second arm members for supporting a sample light source. The pair of second support members is configured to be able to rotate the supported sample light source about a second axis orthogonal to the first axis. At least one of the first and second arm members is configured to be attachable to and detachable from the base member.
Public/Granted literature
- US20130214120A1 LIGHT SOURCE SUPPORT APPARATUS AND OPTICAL RADIATION CHARACTERISTIC MEASUREMENT APPARATUS USING THE SAME Public/Granted day:2013-08-22
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