发明授权
- 专利标题: Method and apparatus for on-chip debugging
- 专利标题(中): 用于片上调试的方法和装置
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申请号: US13557756申请日: 2012-07-25
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公开(公告)号: US09129061B2公开(公告)日: 2015-09-08
- 发明人: Scott P. Nixon , Tiger Lu , Eric M. Rentschler
- 申请人: Scott P. Nixon , Tiger Lu , Eric M. Rentschler
- 申请人地址: US CA Sunnyvale
- 专利权人: Advanced Micro Devices, Inc.
- 当前专利权人: Advanced Micro Devices, Inc.
- 当前专利权人地址: US CA Sunnyvale
- 主分类号: G06F11/36
- IPC分类号: G06F11/36
摘要:
The present invention provides a method and apparatus for dynamically configuring debug triggering patterns. One example embodiment of the method includes comparing values of bits received on a first subset of a plurality of lines of a bus with a first pattern of bits and capturing values of bits received on a second subset of the plurality of lines of the bus in response to the comparison indicating that the values of the bits received on the first subset of the lines match the first pattern of bits. The exemplary embodiment of the method also includes defining a second pattern for triggering a debug action using the captured values.
公开/授权文献
- US20140032801A1 METHOD AND APPARATUS FOR ON-CHIP DEBUGGING 公开/授权日:2014-01-30
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