Invention Grant
- Patent Title: Abnormal measurement detection device and method for infrared radiation thermometer
- Patent Title (中): 红外辐射温度计异常测量检测装置及方法
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Application No.: US13567866Application Date: 2012-08-06
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Publication No.: US09163992B2Publication Date: 2015-10-20
- Inventor: Yuichi Furukawa , Shingo Nakamura , Yuji Okada , Fumio Kawahara
- Applicant: Yuichi Furukawa , Shingo Nakamura , Yuji Okada , Fumio Kawahara
- Applicant Address: JP Toyota-Shi JP Toyota-Shi
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA,MEIWA E-TEC CO., LTD.
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA,MEIWA E-TEC CO., LTD.
- Current Assignee Address: JP Toyota-Shi JP Toyota-Shi
- Agency: Kenyon & Kenyon LLP
- Priority: JP2007-094131 20070330
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01J5/12 ; G01J5/08 ; G01J5/02 ; G01J5/04 ; G01J5/52
Abstract:
A technique for an infrared radiation thermometer used for thermography that detects measurement abnormality of an infrared radiation thermometer and estimates the causes of the measurement abnormality such as contamination of an objective lens and a malfunction in a mechanism section of the infrared radiation thermometer.
Public/Granted literature
- US20130021601A1 ABNORMAL MEASUREMENT DETECTION DEVICE AND METHOD FOR INFRARED RADIATION THERMOMETER Public/Granted day:2013-01-24
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