Invention Grant
US09164156B2 Apparatus having a back-bias magnet and a semiconductor chip element 有权
具有背偏磁体和半导体芯片元件的装置

Apparatus having a back-bias magnet and a semiconductor chip element
Abstract:
An apparatus may include a back-bias magnet; and a semiconductor chip element; wherein the semiconductor chip element has a sensor for measuring a magnetic field strength; and wherein a contact surface is formed on a contact side of the back-bias magnet and on a contact side of the semiconductor chip element and wherein the contact side of the semiconductor chip element has one or more structures such that the contact surface of the back-bias magnet is shaped in a manner corresponding to the structures of the semiconductor chip element.
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