发明授权
- 专利标题: High-reliability high-speed memristor
- 专利标题(中): 高可靠性高速忆阻器
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申请号: US14127873申请日: 2011-06-24
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公开(公告)号: US09165645B2公开(公告)日: 2015-10-20
- 发明人: Feng Miao , Jianhua Yang , John Paul Strachan , Wei Yi , Gilberto Medeiros Ribeiro , R Stanley Williams
- 申请人: Feng Miao , Jianhua Yang , John Paul Strachan , Wei Yi , Gilberto Medeiros Ribeiro , R Stanley Williams
- 申请人地址: US TX Houston
- 专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人地址: US TX Houston
- 代理机构: Hewlett-Packard Patent Department
- 国际申请: PCT/US2011/041881 WO 20110624
- 国际公布: WO2012/177265 WO 20121227
- 主分类号: G11C13/00
- IPC分类号: G11C13/00 ; H01L45/00
摘要:
A memristor has a first electrode, a second electrode parallel to the first electrode, and a switching layer disposing between the first and second electrodes. The switching layer contains a conduction channel and a reservoir zone. The conduction channel has a Fermi glass material with a variable concentration of mobile ions. The reservoir zone is laterally disposed relative to the conduction channel, and functions as a source/sink of mobile ions for the conduction channel. In the switching operation, under the cooperative driving force of both electric field and thermal effects, the mobile ions are moved into or out of the laterally disposed reservoir zone to vary the concentration of the mobile ions in the conduction channel to change the conductivity of the Fermi glass material.
公开/授权文献
- US20140112059A1 HIGH-RELIABILITY HIGH-SPEED MEMRISTOR 公开/授权日:2014-04-24
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