Invention Grant
- Patent Title: Waveform calibration using built in self test mechanism
- Patent Title (中): 使用内置自检机构进行波形校准
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Application No.: US14137994Application Date: 2013-12-20
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Publication No.: US09176188B2Publication Date: 2015-11-03
- Inventor: Sudipto Chakraborty , Jens Graul
- Applicant: Texas Instruments Incorporated , Texas Instruments Deutschland GMBH
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Frank D. Cimino
- Main IPC: H04B3/46
- IPC: H04B3/46 ; G01R31/317 ; H04B17/00

Abstract:
A system on a chip (SoC) includes a transceiver comprising a transmitter having a power amplifier and a receiver having a signal buffer. At least one of the transmitter and receiver has a configurable portion that can be configured to produce a range of waveforms (both in waveshape as well as duty cycle). A low cost built in self test (BIST) logic is coupled to the transceiver. The BIST logic is operable to calibrate the configurable portion of the transceiver to produce a waveform that has a selected harmonic component that has an amplitude that is less than a threshold value. Current consumed by the transceiver may be dynamically reduced by selecting an optimized waveform that has low harmonic components.
Public/Granted literature
- US20150177326A1 Waveform Calibration Using Built In Self Test Mechanism Public/Granted day:2015-06-25
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