Invention Grant
US09176191B2 Continuity test in electronic devices with multiple-connection leads
有权
具有多重连接线的电子设备的连续性测试
- Patent Title: Continuity test in electronic devices with multiple-connection leads
- Patent Title (中): 具有多重连接线的电子设备的连续性测试
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Application No.: US13913883Application Date: 2013-06-10
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Publication No.: US09176191B2Publication Date: 2015-11-03
- Inventor: Giorgio Rossi , Carlo Caimi , Matteo Brivio
- Applicant: STMICROELECTRONICS S.R.L.
- Applicant Address: IT Agrate Brianza (MB)
- Assignee: STMICROELECTRONICS S.R.L.
- Current Assignee: STMICROELECTRONICS S.R.L.
- Current Assignee Address: IT Agrate Brianza (MB)
- Agency: Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
- Priority: ITMI2012A1059 20120618
- Main IPC: G01R31/3187
- IPC: G01R31/3187 ; G01R31/28 ; H01L21/66
Abstract:
An electronic device includes an electronic component having terminals including a set of first terminals and a set of second terminals, a protective package embedding the electronic component, leads exposed from the protective package including a set of first leads and a set of second leads, for each first lead a first electrical connection inside the protection package between the first lead and a corresponding one of the first terminals, and for each second lead electrical connections inside the protective package each one between the second lead and a corresponding one of the second terminals. For each second lead the electronic component includes test structures, each being coupled between a corresponding one of the second terminals connected to the second lead and a corresponding test one of the first terminals connected to a test one of the first leads.
Public/Granted literature
- US20130335107A1 CONTINUITY TEST IN ELECTRONIC DEVICES WITH MULTIPLE-CONNECTION LEADS Public/Granted day:2013-12-19
Information query
IPC分类:
