Invention Grant
- Patent Title: Apparatus and method for in situ current measurement in a conductor
- Patent Title (中): 导体中原位电流测量的装置和方法
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Application No.: US13838576Application Date: 2013-03-15
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Publication No.: US09176203B2Publication Date: 2015-11-03
- Inventor: Mikhail Valeryevich Ivanov , Siva RaghuRam Prasad Chennupati , Viola Schaffer
- Applicant: Texas Instruments Incorporated , TEXAS INSTRUMENTS DEUTSCHLAND GMBH
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Tuenlap D. Chan; Frank D. Cimino
- Main IPC: G01R33/02
- IPC: G01R33/02 ; G01R33/09 ; G01R15/14 ; G01R15/20

Abstract:
Improved current sensing methods and apparatus and conductor apparatus are presented for sensing current in a bus bar or other conductor using one or more circular magnetic sensors or multiple magnetic sensors disposed on a substrate in a pattern surrounding a longitudinal path within the outer periphery of the conductor to avoid or mitigate sensed magnetic field crosstalk and to facilitate use of high sensitivity magnetic sensors at locations inside the conductor periphery in which the magnetic field is relatively small.
Public/Granted literature
- US20140218018A1 APPARATUS AND METHOD FOR IN SITU CURRENT MEASUREMENT IN A CONDUCTOR Public/Granted day:2014-08-07
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