Invention Grant
US09183070B2 Resting blocks of memory cells in response to the blocks being deemed to fail
有权
响应于被认为失败的块，休息的存储器单元块
- Patent Title: Resting blocks of memory cells in response to the blocks being deemed to fail
- Patent Title (中): 响应于被认为失败的块，休息的存储器单元块
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Application No.: US13949560Application Date: 2013-07-24
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Publication No.: US09183070B2Publication Date: 2015-11-10
- Inventor: Todd Marquart , Sampath Ratnam , Sean Eilert
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G06F11/07
- IPC: G06F11/07
Abstract:
In an embodiment, a block of memory cells is rested in response to the block of memory cells being deemed to fail. For some embodiments, a rested block may be selected for use in response to passing an operation. In other embodiments, a rested block may be rested again or may be permanently retired from further use in response to failing the operation.
Public/Granted literature
- US20150033087A1 RESTING BLOCKS OF MEMORY CELLS IN RESPONSE TO THE BLOCKS BEING DEEMED TO FAIL Public/Granted day:2015-01-29
Information query
