Invention Grant
US09188630B2 Method for inspecting short-circuit of circuit layout and device using the same 有权
检查电路布局短路的方法及使用其的装置

Method for inspecting short-circuit of circuit layout and device using the same
Abstract:
A method for inspecting short-circuit of circuit layout and a device using the same are provided, the method including: obtaining a circuit layout, wherein the circuit layout including a plurality of components; searching at least one of physical short-circuit components on the circuit layout among the components; adjusting the at least one of the physical short-circuit components so as to set the at least one of the physical short-circuit components to an open circuit state; inspecting whether the circuit layout has a short-circuit; and recovering the at least one of the physical short-circuit components to the at least one of the physical short-circuit components before adjustment. Thus, the short-circuit errors needed to be corrected in the circuit layout are detected exactly.
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