Invention Grant
- Patent Title: Method for inspecting short-circuit of circuit layout and device using the same
- Patent Title (中): 检查电路布局短路的方法及使用其的装置
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Application No.: US13609279Application Date: 2012-09-11
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Publication No.: US09188630B2Publication Date: 2015-11-17
- Inventor: Lin-Jian Wu , Lung-Ming Chan
- Applicant: Lin-Jian Wu , Lung-Ming Chan
- Applicant Address: TW New Taipei
- Assignee: Wistron Corporation
- Current Assignee: Wistron Corporation
- Current Assignee Address: TW New Taipei
- Agency: Jianq Chyun IP Office
- Priority: CN201210172076 20120529
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06F19/00 ; G06F17/50

Abstract:
A method for inspecting short-circuit of circuit layout and a device using the same are provided, the method including: obtaining a circuit layout, wherein the circuit layout including a plurality of components; searching at least one of physical short-circuit components on the circuit layout among the components; adjusting the at least one of the physical short-circuit components so as to set the at least one of the physical short-circuit components to an open circuit state; inspecting whether the circuit layout has a short-circuit; and recovering the at least one of the physical short-circuit components to the at least one of the physical short-circuit components before adjustment. Thus, the short-circuit errors needed to be corrected in the circuit layout are detected exactly.
Public/Granted literature
- US20130325389A1 METHOD FOR INSPECTING SHORT-CIRCUIT OF CIRCUIT LAYOUT AND DEVICE USING THE SAME Public/Granted day:2013-12-05
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