Invention Grant
US09191599B2 Correlated double sampling circuit and image sensor including the same
有权
相关的双采样电路和图像传感器包括相同的
- Patent Title: Correlated double sampling circuit and image sensor including the same
- Patent Title (中): 相关的双采样电路和图像传感器包括相同的
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Application No.: US13778591Application Date: 2013-02-27
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Publication No.: US09191599B2Publication Date: 2015-11-17
- Inventor: Yu-Jin Park , Kyo-Jin Choo , Ji-Hun Shin , Ji-Min Cheon , Jin-Ho Seo , Seog-Heon Ham
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2012-0038219 20120413
- Main IPC: H04N5/335
- IPC: H04N5/335 ; H04N5/00 ; H04N5/378 ; H04N5/357

Abstract:
A correlated double sampling (CDS) circuit included in an image sensor includes a sampling unit and a timing controlled band-limitation (TCBL) unit. The sampling unit is configured to generate an output signal by performing a CDS operation with respect to a reset component of an input signal and an image component of the input signal based on a ramp signal, the input signal being provided from a pixel array included in the image sensor. The TCBL unit is connected to the sampling unit, and is configured to remove noise from the output signal based on a timing control signal. The timing control signal is activated during a first comparison duration, in which a first comparison operation is performed with respect to the ramp signal and the reset component of the input signal, and during a second comparison duration, in which a second comparison operation is performed with respect to the ramp signal and the image component of the input signal.
Public/Granted literature
- US20130270420A1 CORRELATED DOUBLE SAMPLING CIRCUIT AND IMAGE SENSOR INCLUDING THE SAME Public/Granted day:2013-10-17
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