Invention Grant
US09194775B2 Guided slicing system for obtaining histological samples and methods thereof
有权
引导切片系统,用于获得组织学样本及其方法
- Patent Title: Guided slicing system for obtaining histological samples and methods thereof
- Patent Title (中): 引导切片系统,用于获得组织学样本及其方法
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Application No.: US13954235Application Date: 2013-07-30
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Publication No.: US09194775B2Publication Date: 2015-11-24
- Inventor: Yael S. Schiffenbauer
- Applicant: ASPECT IMAGING LTD
- Applicant Address: IL Shoham
- Assignee: ASPECT IMAGING LTD.
- Current Assignee: ASPECT IMAGING LTD.
- Current Assignee Address: IL Shoham
- Main IPC: G01N1/28
- IPC: G01N1/28 ; G01N1/06 ; G01N1/31

Abstract:
Systems and methods for providing guided slicing of histological samples. The samples are acquired, spacially labeled with a fiducial marker, and imaged with a scanning system. The images are analyzed, either manually, semi-automatically or automatically, and likely locations of pathologies are identified. A slicing program is then generated and the sample sliced according to the slicing program, thereby ensuring that likely locations of pathologies are analyzed.
Public/Granted literature
- US20140030757A1 GUIDED SLICING SYSTEM FOR OBTAINING HISTOLOGICAL SAMPLES AND METHODS THEREOF Public/Granted day:2014-01-30
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