Invention Grant
- Patent Title: Image acquisition method and transmission electron microscope
- Patent Title (中): 图像采集方法和透射电子显微镜
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Application No.: US14509402Application Date: 2014-10-08
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Publication No.: US09196456B2Publication Date: 2015-11-24
- Inventor: Hirofumi Iijima
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2013-219239 20131022
- Main IPC: H01J37/21
- IPC: H01J37/21 ; H01J37/22 ; H01J37/26

Abstract:
An image acquisition method and system for use in transmission electron microscopy and capable of providing information about a wide range of frequency range. The method is initiated with setting at least one of the spherical aberration coefficient and chromatic aberration coefficient of the imaging system of the microscope to suppress attenuation of a contrast transfer function due to an envelope function. Then, an image is obtained by the imaging system placed in defocus conditions.
Public/Granted literature
- US20150136980A1 Image Acquisition Method and Transmission Electron Microscope Public/Granted day:2015-05-21
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