Invention Grant
- Patent Title: Semiconductor devices having carbon-contained porous insulation over gate stack structures
- Patent Title (中): 半导体器件在栅极堆叠结构上具有含碳多孔绝缘
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Application No.: US14519821Application Date: 2014-10-21
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Publication No.: US09196630B2Publication Date: 2015-11-24
- Inventor: Bo-Young Lee , Jongwan Choi , Myoungbum Lee
- Applicant: Bo-Young Lee , Jongwan Choi , Myoungbum Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce
- Priority: KR10-2011-0088588 20110901
- Main IPC: H01L29/792
- IPC: H01L29/792 ; H01L27/115 ; H01L21/764 ; H01L21/762 ; H01L23/528 ; H01L23/532

Abstract:
Semiconductor devices, and methods of fabricating the same, include forming a trench between a plurality of patterns on a substrate to be adjacent to each other, forming a first sacrificial layer in the trench, forming a first porous insulation layer having a plurality of pores on the plurality of patterns and on the first sacrificial layer, and removing the first sacrificial layer through the plurality of pores of the first porous insulation layer to form a first air gap between the plurality of patterns and under the first porous insulation layer.
Public/Granted literature
- US20150060988A1 SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME Public/Granted day:2015-03-05
Information query
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