Invention Grant
- Patent Title: Methods of forming capacitors
- Patent Title (中): 形成电容器的方法
-
Application No.: US14147895Application Date: 2014-01-06
-
Publication No.: US09196673B2Publication Date: 2015-11-24
- Inventor: Gurpreet Lugani , Kevin J. Torek
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John, P.S.
- Main IPC: H01L21/20
- IPC: H01L21/20 ; H01L21/302 ; H01L21/461 ; H01L49/02 ; H01L27/108 ; H01L21/311

Abstract:
A method of forming capacitors includes providing first capacitor electrodes within support material. The first capacitor electrodes contain TiN and the support material contains polysilicon. The polysilicon-containing support material is dry isotropically etched selectively relative to the TiN-containing first capacitor electrodes using a sulfur and fluorine-containing etching chemistry. A capacitor dielectric is formed over sidewalls of the first capacitor electrodes and a second capacitor electrode is formed over the capacitor dielectric. Additional methods are disclosed.
Public/Granted literature
- US20140120684A1 Methods of Forming Capacitors Public/Granted day:2014-05-01
Information query
IPC分类: