发明授权
- 专利标题: Device and method for determining at least one value associated with the electromagnetic radiation of an object being tested
- 专利标题(中): 用于确定与被测试物体的电磁辐射相关联的至少一个值的装置和方法
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申请号: US12735876申请日: 2009-02-17
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公开(公告)号: US09201109B2公开(公告)日: 2015-12-01
- 发明人: Philippe Garreau , Per Iversen , Arnaud Gandois , Luc Duchesne
- 申请人: Philippe Garreau , Per Iversen , Arnaud Gandois , Luc Duchesne
- 申请人地址: FR
- 专利权人: Microwave Vision
- 当前专利权人: Microwave Vision
- 当前专利权人地址: FR
- 代理机构: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- 优先权: FR0851093 20080220
- 国际申请: PCT/EP2009/051861 WO 20090217
- 国际公布: WO2009/103702 WO 20090827
- 主分类号: G01R31/02
- IPC分类号: G01R31/02 ; G01R31/00 ; G01R29/08
摘要:
The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterized in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.
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