公开(公告)号：US20100320996A1

公开(公告)日：2010-12-23

申请号：US12735876

申请日：2009-02-17

申请人： Philippe Garreau ,  Per Iversen ,  Arnaud Gandois ,  Luc Duchesne

发明人： Philippe Garreau ,  Per Iversen ,  Arnaud Gandois ,  Luc Duchesne

IPC分类号： G01R31/02 ,  G01R1/06

CPC分类号： G01R31/001 ,  G01R29/0864

摘要： The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterised in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.

摘要翻译： 本发明涉及一种用于确定被测试对象的电磁辐射的至少一个特性的装置（10）和探测网络（100），其特征在于，其包括用于滑动所述探测网络的装置（200） 100）自身具有探针网络（100）和被测试物体之间的相对偏移，其高于探针网络（100）的间距，以便沿着探针网络的多个相对位置执行测量 （100）和被测对象，并访问被测对象的特定区域; 提供了用于相对于被测试物体定位，调整和对准探针网络（100）以便朝向/接近/贴合到被测试物体上的装置，并且提供了用于机械扫描探针网络周围的装置 或者在被测物体的前面，以便沿球形，圆柱形或平面形状进行测量。

公开(公告)号：US20070018654A1

公开(公告)日：2007-01-25

申请号：US10568378

申请日：2004-08-13

申请人： Philippe Garreau ,  Luc Duchesne ,  Per Iversen ,  Arnaud Gandois

发明人： Philippe Garreau ,  Luc Duchesne ,  Per Iversen ,  Arnaud Gandois

IPC分类号： G01R31/00

CPC分类号： G01R29/0821

摘要： The invention relates to an arrangement for measuring the radiation of an electromagnetic device, said arrangement essentially comprising a support (20) for positioning said device, an arc (10), a network of measuring probes that are distributed over the arc (10), essentially describing a circle which is centred on the support, and means for driving the device in rotation between the support (20) and the arc (10), about a geometrical axis merged into the plane of the arc (10). The inventive arrangement is characterised in that the device support (20) and the arc (10) can also be pivoted about a geometrical axis that is transversal to the plane of the arc (10), the device including means for holding the support (20) and the arc (10) in the selected position after rotation about the second geometrical axis.

摘要翻译： 本发明涉及一种用于测量电磁装置的辐射的装置，所述装置基本上包括用于定位所述装置的支撑件（20），电弧（10），分布在电弧（10）上的测量探针网络， 基本上描述以支撑为中心的圆，以及用于围绕合并到电弧（10）的平面中的几何轴线在支撑件（20）和电弧（10）之间旋转驱动装置的装置。 本发明的装置的特征在于，装置支撑件（20）和电弧（10）也可以围绕横向于电弧（10）的平面的几何轴线枢转，该装置包括用于保持支撑件（20）的装置 ）和弧（10）在围绕第二几何轴线旋转之后处于选定位置。

公开(公告)号：US09201109B2

公开(公告)日：2015-12-01

申请号：US12735876

申请日：2009-02-17

申请人： Philippe Garreau ,  Per Iversen ,  Arnaud Gandois ,  Luc Duchesne

发明人： Philippe Garreau ,  Per Iversen ,  Arnaud Gandois ,  Luc Duchesne

IPC分类号： G01R31/02 ,  G01R31/00 ,  G01R29/08

CPC分类号： G01R31/001 ,  G01R29/0864

摘要： The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterized in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.

摘要翻译： 本发明涉及一种用于确定被测试对象的电磁辐射的至少一个特性的装置（10）和探测网络（100），其特征在于，其包括用于滑动所述探测网络的装置（200） 100）自身具有探针网络（100）和被测试物体之间的相对偏移，其高于探针网络（100）的间距，以便沿着探针网络的多个相对位置执行测量 （100）和被测对象，并访问被测对象的特定区域; 提供了用于相对于被测试物体定位，调整和对准探针网络（100）以便朝向/接近/贴合到被测试物体上的装置，并且提供了用于机械扫描探针网络周围的装置 或者在被测物体的前面，以便沿球形，圆柱形或平面形状进行测量。

公开(公告)号：US08482294B2

公开(公告)日：2013-07-09

申请号：US13001004

申请日：2009-06-23

申请人： Philippe Garreau ,  Per Iversen ,  Luc Duchesne ,  Arnaud Gandois

发明人： Philippe Garreau ,  Per Iversen ,  Luc Duchesne ,  Arnaud Gandois

IPC分类号： H01F27/36

CPC分类号： G01R29/0821

摘要： A device (300) for the relative positioning of an electromagnetic probe network (100) and of an object being tested (200). The device includes at least a sliding element (301) to provide for the relative sliding of the object being tested (200) or of the electromagnetic probe network (100), to move the object being tested (200) or the probe network (100) along at least one sliding direction included in a plane of the probe network (100), and on which is provided a rotation device (320) for the relative rotation of the object being tested (200) and of the probe network (100) about a main rotation axis perpendicular to the sliding direction.

摘要翻译： 一种用于电磁探针网络（100）和待测物体（200）的相对定位的装置（300）。 该装置至少包括滑动元件（301），用于提供被测试物体（200）或电磁探针网络（100）的相对滑动，以移动待测物体（200）或探针网络（100） 沿着包括在探针网络（100）的平面中的至少一个滑动方向，并且设置有用于被测试物体（200）和探针网络（100）的相对旋转的旋转装置（320） 围绕垂直于滑动方向的主旋转轴。

公开(公告)号：US08093912B2

公开(公告)日：2012-01-10

申请号：US12442909

申请日：2007-09-25

申请人： Philippe Garreau ,  Jérôme Drean ,  Luc Duchesne ,  Arnaud Gandois ,  Ludovic Durand ,  Virginie Tessier ,  Per Iversen ,  Nicolas Robic

发明人： Philippe Garreau ,  Jérôme Drean ,  Luc Duchesne ,  Arnaud Gandois ,  Ludovic Durand ,  Virginie Tessier ,  Per Iversen ,  Nicolas Robic

IPC分类号： G01R27/04 ,  A61B5/05 ,  G06K9/00

CPC分类号： G01N22/02 ,  G01N9/002

摘要： The invention relates to a device for controlling a material, the device including at least one transmitter for transmitting an electromagnetic signal at a carrier frequency Fp to illuminate the material and one receiver for receiving the electromagnetic signal, wherein the device further includes a first modulator for modulating the electromagnetic signal at a frequency Fm1, the first modulator being arranged, on the signal path, between the transmitter and the material in order to spatially sample the emitted electromagnetic signal; second modulator for modulating the electromagnetic signal at a frequency Fm2, the second modulator being arranged, on the signal path, between the material and the electromagnetic signal receiver in order to spatially sample the electromagnetic signal passed through the material.

摘要翻译： 本发明涉及一种用于控制材料的装置，该装置包括至少一个发射器，用于以载波频率Fp发送电磁信号以照射材料和一个用于接收电磁信号的接收器，其中该装置还包括第一调制器 以频率Fm1调制电磁信号，第一调制器在信号路径上布置在发射机和材料之间，以便对发射的电磁信号进行空间采样; 用于以频率Fm2调制电磁信号的第二调制器，第二调制器在信号路径上布置在材料和电磁信号接收器之间，以便对通过该材料的电磁信号进行空间采样。

公开(公告)号：US20110121839A1

公开(公告)日：2011-05-26

申请号：US13001004

申请日：2009-06-23

申请人： Arnaud Gandois ,  Luc Duchesne ,  Per Iversen ,  Philippe Garreau

发明人： Arnaud Gandois ,  Luc Duchesne ,  Per Iversen ,  Philippe Garreau

IPC分类号： G01R27/04

CPC分类号： G01R29/0821

摘要： The invention relates to a device (300) for the relative positioning of an electromagnetic probe network (100) and of an object being tested (200), wherein said device includes at least a means (301) or the relative sliding of the object being tested (200) and of the electromagnetic probe network (100), capable of moving the object being tested (200) or the probe network (100) along at least one sliding direction included in a plane of the probe network (100), and on which are provided a means (320) for the relative rotation of the object being tested (200) and of the probe network (100) about a main rotation axis perpendicular to the sliding direction.

摘要翻译： 本发明涉及一种用于电磁探针网络（100）和被测试物体（200）的相对定位的装置（300），其中所述装置至少包括装置（301）或物体的相对滑动 沿着包括在探测网络（100）的平面中的至少一个滑动方向，能够移动被测试对象（200）或探测网络（100）的测试（200）和电磁探测网络（100），以及 在其上设置有用于被测物体（200）和探针网（100）围绕垂直于滑动方向的主旋转轴相对旋转的装置（320）。

公开(公告)号：US20100005891A1

公开(公告)日：2010-01-14

申请号：US12442909

申请日：2007-09-25

申请人： Philippe Garreau ,  Jérôme Drean ,  Luc Duchesne ,  Arnaud Gandois ,  Ludovic Durand ,  Virginie Tessier ,  Per Iversen ,  Nicolas Robic

发明人： Philippe Garreau ,  Jérôme Drean ,  Luc Duchesne ,  Arnaud Gandois ,  Ludovic Durand ,  Virginie Tessier ,  Per Iversen ,  Nicolas Robic

IPC分类号： G01N22/00

CPC分类号： G01N22/02 ,  G01N9/002

摘要： The invention relates to a device for controlling a material, said device comprising at least means for transmitting an electromagnetic signal at a carrier frequency Fp to illuminate the material and means for receiving the electromagnetic signal, characterized in that said device further comprises first means for modulating the electromagnetic signal at a frequency Fm1, said modulation means being arranged, on the signal path, between the transmission means and the material in order to spatially sample the emitted electromagnetic signal; second means for modulating the electromagnetic signal at a frequency Fm2, said modulation means being arranged, on the signal path, between the material and the electromagnetic signal reception means in order to spatially sample the electromagnetic signal passed through the material.

摘要翻译： 本发明涉及一种用于控制材料的装置，所述装置至少包括用于以载波频率Fp发送电磁信号以照射材料和用于接收电磁信号的装置的装置，其特征在于，所述装置还包括第一装置，用于调制 在频率Fm1处的电磁信号，所述调制装置在信号路径上布置在传输装置和材料之间，以便对发射的电磁信号进行空间采样; 用于以频率Fm2调制电磁信号的第二装置，所述调制装置在信号路径上布置在材料和电磁信号接收装置之间，以便对通过该材料的电磁信号进行空间采样。