Invention Grant
- Patent Title: Magnetic profile measuring device and method for measuring magnetic profile for alternating-current magnetic field
- Patent Title (中): 磁轮测量装置及测量交流磁场磁特性的方法
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Application No.: US14347417Application Date: 2012-09-25
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Publication No.: US09222914B2Publication Date: 2015-12-29
- Inventor: Hitoshi Saito , Satoru Yoshimura
- Applicant: AKITA UNIVERSITY
- Applicant Address: JP Akita-shi, Akita
- Assignee: AKITA UNIVERSITY
- Current Assignee: AKITA UNIVERSITY
- Current Assignee Address: JP Akita-shi, Akita
- Agency: Ladas & Parry LLP
- Priority: JP2011-210009 20110926
- International Application: PCT/JP2012/074600 WO 20120925
- International Announcement: WO2013/047538 WO 20130404
- Main IPC: G01R33/12
- IPC: G01R33/12 ; G01N27/72 ; G01Q30/04 ; G01Q60/54 ; G01R33/038 ; B82Y35/00

Abstract:
A magnetic profile measuring device which scans a space where an alternating-current magnetic field exists by a magnetized probe on a tip of a driven cantilever, detects vibration of the cantilever, and generates an image of magnetic field distribution of the space, the device including: the cantilever having the probe equipped on the tip thereof; a driver driving the cantilever; a vibration sensor detecting vibration of the probe wherein the driven vibration of the cantilever is frequency-modulated by the alternating-current magnetic field; a demodulator demodulating from a detection signal of the vibration sensor a magnetic signal corresponding to an alternating-current magnetic field; a scanning mechanism; a data storage storing an initial data for each coordinate of the space; a modified data generator recalling the initial data from the data storage and generating a plurality of data by modifying the phase of the initial data; and an image display device.
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