发明授权
- 专利标题： Trace structure for the touch panel and electrical testing method
- 专利标题（中）： 触摸屏的跟踪结构和电气测试方法
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申请号： US13928119申请日： 2013-06-26
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公开(公告)号： US09224544B2公开(公告)日： 2015-12-29
- 发明人: Hung-Chen Kao , Yu-Sheng Lin , Chia-Feng Teng
- 申请人： Hannstar Display Corp
- 申请人地址： TW New Taipei
- 专利权人： HANNSTAR DISPLAY CORP
- 当前专利权人： HANNSTAR DISPLAY CORP
- 当前专利权人地址： TW New Taipei
- 代理机构： Muncy, Geissler, Olds & Lowe, P.C.
- 优先权： CN201210243276 20120713
- 主分类号： G01R31/26
- IPC分类号： G01R31/26 ; H01H1/06 ; G06F3/041
摘要：
A trace structure for a touch panel having a transparent substrate with a touch sensing region and a border region surrounding the touch sensing region, the trace structure including: a plurality of traces disposed on the transparent substrate and within the border region; a plurality of bonding pads disposed in the border region of the transparent substrate, wherein each bonding pad has a first side and a second side, and the first side of each bonding pad is connected to a corresponding trace of the plurality of traces; and at least two trace extending portions extended toward an outer edge of the border region from the second side of two of the plurality of bonding pads.
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