Invention Grant
- Patent Title: Antireflection substrate structure and manufacturing method thereof
- Patent Title (中): 抗反射基板结构及其制造方法
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Application No.: US13761158Application Date: 2013-02-07
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Publication No.: US09224893B2Publication Date: 2015-12-29
- Inventor: Chiung-Wei Lin , Jheng-Jie Ruan , Yi-Liang Chen , Hsien-Chieh Lin
- Applicant: Tatung Company , TATUNG UNIVERSITY
- Applicant Address: TW Taipei TW Taipei
- Assignee: Tatung Company,TATUNG UNIVERSITY
- Current Assignee: Tatung Company,TATUNG UNIVERSITY
- Current Assignee Address: TW Taipei TW Taipei
- Agency: Jianq Chyun IP Office
- Priority: TW101145833A 20121206
- Main IPC: H01L31/02
- IPC: H01L31/02 ; H01L31/0236 ; H01L31/0216

Abstract:
A manufacturing method of antireflection substrate structure includes: providing a silicon wafer having a first rough surface; forming an antireflection optical film on the silicon wafer, wherein the antireflection optical film conformally overlays the first rough surface; performing a surface treatment on the antireflection optical film so that the antireflection optical film has a hydrophilic surface, and the hydrophilic surface is relatively far away from the silicon wafer; dropping a colloidal solution on the hydrophilic surface of the antireflection optical film, wherein the colloidal solution includes a solution and multiple nano-balls and the nano-balls are adhered onto the hydrophilic surface; and performing an etching process on the hydrophilic surface of the antireflection optical film by taking the nano-balls as an etching mask so as to form a second rough surface, wherein the roughness of the second rough surface is different from the roughness of the first rough surface.
Public/Granted literature
- US20140159187A1 ANTIREFLECTION SUBSTRATE STRUCTURE AND MANUFACTURING METHOD THEREOF Public/Granted day:2014-06-12
Information query
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