发明授权
- 专利标题: Automatic analyzer and sample-processing system
- 专利标题(中): 自动分析仪和样品处理系统
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申请号: US13560114申请日: 2012-07-27
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公开(公告)号: US09229019B2公开(公告)日: 2016-01-05
- 发明人: Hitoshi Tokieda , Yoshimitsu Takagi , Takeshi Shibuya , Masashi Akutsu
- 申请人: Hitoshi Tokieda , Yoshimitsu Takagi , Takeshi Shibuya , Masashi Akutsu
- 申请人地址: JP Tokyo
- 专利权人: HITACH HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人: HITACH HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly & Malur, PC
- 优先权: JP2007-331312 20071225
- 主分类号: G01N35/04
- IPC分类号: G01N35/04 ; G01N35/02
摘要:
A sample-processing system that improves total system processing efficiency, and reduces a sample-processing time, by establishing a functionally independent relationship between a rack conveyance block with rack supply, conveyance, and recovery functions, and a processing block with sample preprocessing, analysis, and other functions. A buffer unit with random accessibility to multiple racks standing by for processing is combined with each of multiple processing units to form a pair, and the system is constructed to load and unload racks into and from the buffer unit through the rack conveyance block so that one unprocessed rack is loaded into the buffer unit and then upon completion of process steps up to automatic retesting, unloaded from the buffer unit. Functional dependence between any processing unit and a conveyance unit is thus eliminated.
公开/授权文献
- US20120294764A1 AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM 公开/授权日:2012-11-22