Invention Grant
- Patent Title: Channel quality information and beam index reporting
- Patent Title (中): 频道质量信息和波束索引报告
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Application No.: US13781311Application Date: 2013-02-28
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Publication No.: US09237475B2Publication Date: 2016-01-12
- Inventor: Kaushik Morapakkam Josiam , Ankit Gupta , Shadi Abu-Surra , Zhouyue Pi , Ying Li , Sridhar Rajagopal
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Main IPC: H04W24/10
- IPC: H04W24/10 ; H04W72/04
Abstract:
A method and apparatus report or identify channel quality information. The method for reporting includes selecting one or more beams for channel quality reporting. The method also includes mapping, by the UE, indices of the one or more selected beams to one or more channel quality values. Additionally, the method includes sending channel quality information for the one or more selected beams according to the mapping. The method for identifying includes receiving an indication of indices of one or more beams selected for reporting. The method also includes receiving channel quality information for the one or more selected beams. The method further includes identifying a mapping of the indices of the one or more selected beams to one or more channel quality values. Additionally, the method includes identifying a channel quality value for each of the one or more selected beams according to the mapping.
Public/Granted literature
- US20130235742A1 CHANNEL QUALITY INFORMATION AND BEAM INDEX REPORTING Public/Granted day:2013-09-12
Information query
