Invention Grant
- Patent Title: Optical measurement probe, and optical measurement device provided with the same
- Patent Title (中): 光学测量探头,以及配备其的光学测量装置
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Application No.: US14481230Application Date: 2014-09-09
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Publication No.: US09239298B2Publication Date: 2016-01-19
- Inventor: Tetsuya Nagai , Nobuyuki Iwai , Yasuyuki Furukawa , Ryoji Hiraoka , Isao Azumagakito , Satoru Okada
- Applicant: SHIMADZU CORPORATION , HONDA MOTOR CO., LTD.
- Applicant Address: JP Kyoto-shi JP Tokyo
- Assignee: SHIMADZU CORPORATION,HONDA MOTOR CO., LTD.
- Current Assignee: SHIMADZU CORPORATION,HONDA MOTOR CO., LTD.
- Current Assignee Address: JP Kyoto-shi JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2013-195553 20130920
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01N21/958 ; G01M15/04 ; G01N21/94 ; G02B1/02 ; G01J5/08 ; G01J5/00 ; G01J5/04 ; F02P13/00 ; G01N21/15 ; G01N21/67 ; G01D5/353 ; G01J3/02 ; G02B6/26 ; F02D35/02 ; H01T13/40

Abstract:
There are provided an optical measurement probe capable of obtaining a more stable measurement result, and an optical measurement device provided with the same. An incidence surface of an optical window to be used in a high temperature environment is covered by a deposited film. The optical window is formed of sapphire, and the deposited film is formed from SiO2. Adhesion of dirt to the incidence surface, and an influence, on a measurement result, of the adhesion of dirt on the incidence surface can thereby be prevented, and a more stable measurement result can be obtained.
Public/Granted literature
- US20150085283A1 OPTICAL MEASUREMENT PROBE, AND OPTICAL MEASUREMENT DEVICE PROVIDED WITH THE SAME Public/Granted day:2015-03-26
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