Invention Grant
US09239298B2 Optical measurement probe, and optical measurement device provided with the same 有权
光学测量探头,以及配备其的光学测量装置

Optical measurement probe, and optical measurement device provided with the same
Abstract:
There are provided an optical measurement probe capable of obtaining a more stable measurement result, and an optical measurement device provided with the same. An incidence surface of an optical window to be used in a high temperature environment is covered by a deposited film. The optical window is formed of sapphire, and the deposited film is formed from SiO2. Adhesion of dirt to the incidence surface, and an influence, on a measurement result, of the adhesion of dirt on the incidence surface can thereby be prevented, and a more stable measurement result can be obtained.
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